Professional Committee of Rock and Mineral Testing Technology of the Geological Society of China, National Geological Experiment and Testing CenterHost
2015 Vol. 34, No. 6
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HU Yong-ping, YU Xue-feng, ZHENG Lin-wei, ZHENG Yi-fan. Application of High-resolution Scanning Electron Microscope and X-ray Energy Dispersive Spectroscope Mapping Technique to Study the Composition and Morphology of Tellurium Minerals[J]. Rock and Mineral Analysis, 2015, 34(6): 643-651. doi: 10.15898/j.cnki.11-2131/td.2015.06.007
Citation: HU Yong-ping, YU Xue-feng, ZHENG Lin-wei, ZHENG Yi-fan. Application of High-resolution Scanning Electron Microscope and X-ray Energy Dispersive Spectroscope Mapping Technique to Study the Composition and Morphology of Tellurium Minerals[J]. Rock and Mineral Analysis, 2015, 34(6): 643-651. doi: 10.15898/j.cnki.11-2131/td.2015.06.007

Application of High-resolution Scanning Electron Microscope and X-ray Energy Dispersive Spectroscope Mapping Technique to Study the Composition and Morphology of Tellurium Minerals

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